Detectable Elements
We analyze the composition of base materials and their impurities. For this purpose, the proportions of the following elements are detected. Additionally, we can create an overview of the quantitative proportions of all contained and detected elements of the individual sample. Individual elements can be excluded as targets of the analysis if required.
Main Group Elements:
H, Li, Na, K, Rb, Cs, Be, Mg, Ca, Sr, Ba, B, Al, Ga, In, Tl, C, Si, Ge, Sn, Pb, P, As, Sb, Bi, O, Se, Te, F, Cl, Br, J
Subgroup Elements:
Sc, Y, Ti, Zr, Hf, V, Nb, Ta, Cr, Mo, W, Mn, Re, Fe, Co, Ni, Pd, Pt, Cu, Zn, Cd, Hg
Precious Metals:
Ru, Os, Pd, Pt, Rh, Ir, Ag, Au
Lanthanoids:
La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu
All quantitative results of the measurements refer in each case to a defined location on a possibly inhomogeneous sample. For this reason, the location of the sample at which the analysis took place is documented by imaging.
Alternatively, matrix checks can be drawn over the surfaces or defined areas of the sample.
Statements about the contents of non-homogenous granular samples are complex. Therefore, averages can be formed to estimate the entirety of the sample even without preparation. Alternatively, granules or parts of mixtures can be determined individually.
For all specimens, the observation depth can be decisive for measurement accuracy. We are also happy to perform profile analyses of cut specimens through the entire depth of the specimen.
