Laser-Based Material Analysis
Basic Services
In earlier times, photoelectron spectroscopy (PES) or secondary ion mass spectrometry (SIMS) were the primary methods used for material analyses of surfaces. For thin-film analyses, a scanning electron microscope (SEM) and X-ray micro analysis (EDX) or infrared spectroscopy (IR/ATR) were also frequently used.
All these methods are nowadays replaced by laser-based material analysis, which allows one to work under much simpler laboratory conditions and reduces necessary material preparation. The speed and accuracy of the method are particularly substantial.
In the past, additional methods had to be used for the analysis of a surface if the material properties under one or more coatings were to be analyzed in addition to the surface.
Our task is the qualitative and quantitative analysis of the surface and composition of pure materials, alloys, ores, and mixtures.
